Product center

With the original mind, originality
3D Laser Profiler
3D Laser Profiler
Product advantages
  • 01
    Super performance

    Ultra high resolution, the industry's first X-axis resolution can reach 6400 points for ultra fast detection, with a scanning speed of up to 67kHz

  • 02
    Rapid technical support

    Localized services, offices distributed throughout the country timely response to customer on-site, 7*24 hours online support

  • 03
    High cost performance

    Independent research and development, complete independent intellectual property rights, domestic independent production factories; Product support a tow two control system, effectively reduce the system cost

  • 04
    Software is equipped with automatic correction and automatic splicing

    The workpiece position is offset, the software can automatically correct the image; Multiple scanning images can be automatically spliced to achieve stability detection

  • 05
    Output 3D+2D data at the same time

    Combine 2D and 3D data to achieve complete detection; 2D data can be used for positioning, code reading, character recognition, etc.

  • 06
    Rich SDK interface

    It can quickly connect with Halcon, VisionPro, VB, C#, C/C++, Labview and other development environments

01
Super performance
02
Rapid technical support
03
High cost performance
04
Software is equipped with automatic correction and automatic splicing
05
Output 3D+2D data at the same time
06
Rich SDK interface

Product List

Working distance (mm)
Working distance (mm)
  • 20-80.
  • 81-200.
  • 201-500.
  • 500 +
Z-direction field of view (mm)
Z-direction field of view (mm)
  • 2-10
  • 11-20
  • 21-100.
  • 101-500.
  • 500 +
X axis width (mm)
X axis width (mm)
  • 9-40
  • 41-100.
  • 101-500.
  • 500 +
X-axis data interval (μm)
X-axis data interval (μm)
  • 3-10
  • 11 to 25
  • 26-100.
  • 101-200.
  • 200 +
Maximum sampling frequency (Hz)
Maximum sampling frequency (Hz)
  • 750-8000.
  • 2500-13000.
  • 13000-67000.
product
Working distance (mm)
Z-direction field of view (mm)
X axis width (mm)
X-axis data interval (μm)
Maximum sampling frequency (Hz)
Compared
Collect
comparison barhide